Electron & Ion Beam Lithography

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Electromagnetic, thermal and stress analyses of RF components in Opera-3d

Introduction Many high frequency devices operate at high power, and material losses can lead to significant rise in temperature if left unchecked. In such devices, it is important to know the temperature distribution to determine the performance impact of changes in dimensions and material properties, to ensure that the permitted maximum operating temperature and stresses […]

Posted in Charged Particle Devices,Electron & Ion Beam Lithography
Simulating-charge-particle-sources-beams

Simulating Charged-Particle Sources and Beams IOP Webinar

From electron lithography to ion sources to field-tip emitters for flat-screen displays, the modelling of charged particle devices is critical in ensuring optimum efficiency and performance. This webinar discusses the modelling of space-charge-limited emission and particle tracking using the Opera software suite.

Posted in Charged Particle Devices,Electron & Ion Beam Lithography,Electron Beam Guns,Ion Beam Sources,Linear Beam Tubes,Plasma Discharge,Space Charge Ion Beam Compensation,X-Ray Tubes